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The AQ2200-601 10 Gbit/s BERT module is a compact and powerful. It offers high quality features such as built-in internal Signal Generator (SG) and Clock Data Recovery (CDR), EO/OE interfaces, and several variable signal output functions. The AQ2200 series MultiApplication Test System is designed for universal purposes; therefore various modules for various applications can be accommodated. (i.e. Optical Power Meter, Light Source and Optical Attenuator modules).

Product Features:

  • PPG, ED and SG integrated design
  • Handles multiple bit rates (9.95 Gbit/s to 11.32 Gbit/s)
  • Adjust output amplitude, offset and crosspoint
  • Clock and Data Recovery (CDR) function included
  • Compact and lightweight
  • Combine with other optical modules to create a variety of tests
  • Combine with an optical modulator, receiver, and attenuator to measure error rate curves
  • 64 Mbit long program pattern generation capability
  • Output level range: 0.5 to 2.0 Vp-p
  • Offset range: -2.0 V to +3.0 V
  • Cross-point adjustment range: 30 to 70%
  • Input threshold level adjustment
  • Optical modulator and receiver (Optional)

The AQ2200-601 integrates a pulse pattern generator (PPG), error detector (ED) and signal generator (SG) in a compact module, so a single unit can handle bit error rate (BER) measurements. The AQ2200 series has all the modules you need for optical device/system characterization, including optical modulators, receivers, power meters, and attenuators. The AQ2200 Series also includes equipment designed especially for using the 10 Gbit/s band BERT standalone function (using the AQ2211 3-slotmainframe). The small size and light weight of the AQ2200-601 provides the following advantages:

PPG function:

  • Support for multiple bit rates:
    9.95 Gbit/s to 11.32 Gbit/s, variable in steps of 1 kHz
  • Output amplitude:
    0.5 Vp-p to 2.0 Vp-p, variable in steps of 10 mV
  • Offset:
    -2.0 V to +3 V, variable in steps of 10 mV
  • Crosspoint:
    30% to 70%, variable in steps of 1%
  • Data and data bar:
    2 outputs
  • Trigger output for oscilloscope synchronization
  • Port for external 10 G clock synchronization input and 1/16 or 1/64 synchronization input
    It is possible to perform an error rate test with jitter deliberately added to the data pattern by inputting a synchronization signal with added jitter to this port.

Bit error rate test (BERT):

  • A BERT is a type of code error measurement made through digital communication using a PPG as the signal source and an ED as the error detector.
    J030 Tm Aq2200 601 02

ED function:

  • CDR function included as standard feature
    The CDR signal extracts the clock from the data signal and performs synchronization when a data signal is the only input. In optical communications, the CDR function is a useful tool because the data signal is often transmitted alone.
  • In addition to the CDR input port, there are ports for inputting separate data and clock signals. When these ports are used, the phases of the data and clock signals must be matched externally.
  • Input ranges:
    0.1 Vp-p to 0.7 Vp-p (with CDR), 0.1 Vp-p to 0.6 Vp-p (without CDR)

Test patterns:

  • There are two types of test patterns: pseudo-random (PRBS) patterns and program patterns.
  • The PRBS pattern is selected from settings ranging from PRBS7 to PRBS31.
  • In the standard configuration, the AQ2200-601 program pattern consists of 256 bits. A 64 Mbit option is also available.

Supported bit rates:

BERT Specification

Mainframe Screenshot:

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1. Measurement status display
1-1 Elapsed time display

  • Displays the elapsed time

1-2 Logging display

  • Displays an indicator which indicates the logging execution status

1-3 Operation status display

  • System clock error: Displays the system clock status
  • Err on: Displays the PPG error addition ON/OFF status
  • Output Displays the PPG output signal ON/OFF status
  • CDR ulk:Displays the ED CDR function operation status
  • Sync-los: Displays the ED synchronization status
  • Bit-err: Displays the ED bit error detection status

1-4 Measurement result display

  • : Syn-los: Displays the ED synchronization loss time (in microseconds)
  • Err-cnt: Displays the ED received data error count (in bits)
  • Err-rate: Displays the ED received data error rate as a numerical value

2. Function keys start mes

  • Starts measurement
  • Stop mes: Stops measurement
  • Error add: Turns error addition ON/OFF
  • Signal output: Turns PPG data output and clock output ON/OFF
  • Information: Displays the firmware version and other information

3. Setting display

  • Displays the settings. Use the tab key to switch the display

Example Applications

Optical device characteristics evaluation test

J034 Tm Aq2200 601 04

The AQ2200-601 can be used to test and evaluate the characteristics of optical devices such as optical modulators and transmitter optical subassemblies (TOSA). Waveform characteristics can be observed using instruments such as an oscilloscope, optical spectrum analyzer, and optical power meter while varying the amplitude, offset, and crosspoint of the data input signal being input to the modulator driver.

  • Rise and fall times: Tr/Tf, Crosspoint position
  • Overshoot percentage
  • Jitter measurements: Peak to peak and RMS
  • Extinction ratio
  • Pulse mask test
  • Output power (peak, average), light wavelength

XFP module characteristics evaluation test

J034 Tm Aq2200 601 05

The XFP module is an MSA which is an optical transceiver containing an optical transmitter and an optical receiver. XFP technology is very flexible, with support for STM-64/OC-192, 10 G Fibre Channel, and 10 G Ethernet. The XFP module requires the following tests:

  • Jitter test
  • Optical reception sensitivity test
  • Optical output eye mask test

With AQ2200 Series modules, it is possible to install the BERT, optical modulator, optical receiver, optical ATTN, and other equipment in a 19-inch rack to form an extremely compact test system. The AQ2200 series can also handle optical receiver sensitivity tests.

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